3D Microscopy and Microanalysis of Heterogeneous SEM Samples by Broad Ion Beam Processing: Cutting - Etching - Coating

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چکیده

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ژورنال

عنوان ژورنال: Microscopy and Microanalysis

سال: 2002

ISSN: 1431-9276,1435-8115

DOI: 10.1017/s1431927602105435